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Dr. Thomas Fister
Director of Analytical Services, California - Kifer
Dr. Fister received his Ph.D. in Analytical Chemistry from the University of North Carolina at Chapel Hill in 1994 where he specialized in surface analysis techniques including XPS and TOF-SIMS applied to atmospheric chemistry. He continued related work in this field while performing a post doc at the University of California at Irvine before coming to work for Evans Analytical Group.
Initial work at EAG involved contract research utilizing TOF-SIMS. In 1999, he transitioned to the commercial service side of the business in the XPS group.
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