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About EAG

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Techniques & Services

• Overview
• Analytical Techniques
• Auger Electron Spectroscopy (AES, Auger)
• Energy Dispersive X-ray Spectroscopy (EDS)
• Focused Ion Beam (FIB)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gas Chromatography Mass Spectrometry (GC/MS)
• Glow-Discharge Mass Spectrometry (GDMS)
• Inductively Coupled Plasma Spectroscopy (ICP-OES/MS)
• Instrumental Gas Analysis (IGA)
• Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
• Low Energy X-ray Emission Spectrometry (LEXES)
• Raman Spectroscopy (Raman)
• Rutherford Backscattering Spectroscopy (RBS)
  • Ion Channeling
  • Hydrogen Forward Scattering Spectrometry (HFS)
  • Nuclear Reaction Analysis (NRA)
  • Particle Induced X-ray Emission (PIXE)
• Scanning Electron Microscopy (SEM)
• Secondary Ion Mass Spectrometry (SIMS)
• Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)
• Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM)
• Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
• Total Reflection X-ray Fluorescence (TXRF)
• X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)
• X-ray Diffraction (XRD)
• X-ray Fluorescence (XRF)
• X-ray Reflectivity (XRR)
• Services
  • Electrostatic Discharge (ESD) and Latch Up (L-Up)
  • Focused Ion Bean (FIB) – Circuit Edit
  • Decapsulation

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• SIMSview™: SIMS Data Processing Software

Training

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• Working Smarter Seminar
  • Schedule & Fees
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• EAG Online Tutorials
• SIMS Theory
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• RBS Instrumentation
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• Semizone™ Courses

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Contact Us

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• Lab Locations - United States
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• Lab Locations - International
  • SHIVA Technologies Europe SARL (France)
  • Cascade Scientific GmbH (Germany)
  • Cascade Scientific Ltd. (United Kingdom)
  • Evans Analytical Group Shanghai (China)
• Evans Taiwan LLC
• Nano Science Corporation (Japan)
• Sales Representatives