EAG Photovoltaic Solar Energy Solutions

Evans Analytical Group® (EAG) with its wide array of analysis techniques and world-class scientists can provide fast, state-of-the-art measurements that can help give you the insight you need to improve your product’s performance and manufacturing processes.

Application Discussions by PV Industry		Seminars
PV Si Feedstock Evaluation Si Wafer PV Amorphous & Microcrystalline Thin Film PV CdTe Thin Film PV CIGS Thin Film PV III-V for Concentrator PV		Working Smarter^TM with Surface Analytical Techniques

Meet EAG at one of these Industry Events		Papers/Presentations/Application Notes
European Photovoltaic Solar Energy Conference (EU PVSEC) - 6-10 September, Valencia, Spain PV Taiwan - 26-28 October, Taiwan		Analytical Techniques for PV Si Feedstock Evaluation - R. S. Hockett - PA118 PV Silicon Impurity Analysis - BR025 Impurity Analysis of PV Si (Flash Presentation) Quantitative Measurement of Dopants (sub-ppba), Oxygen and Carbon (sub-ppma), and Metals (sub-ppma) in PV Si Feedstock and Wafers by SIMS - PS715 Quality Assurance of Photovoltaic Materials by Direct Sampling High Mass Resolution Glow-Discharge Mass Spectrometry Methods - PS716 SIMS Detection Limits for Selected Impurities in Si Bulk Conditions - AN444 Uniformity Study of B, Al, P, C, O, Ca and Fe in Upgraded Metallurgical Grade Silicon (UMG-Si) by SIMS - AN452 Production Support and Process Control of PV Materials by Direct Sampling High-Resolution Glow Discharge Mass Spectrometry Methods - C. Michellon, K. Putyera, M. Kasik, and R. Hockett - PA117

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"Structuring standards for the photovoltaic manufacturing industry" - Win Baylies, Marty Burkhart, Don Cook, Dick Hockett, Matthias Meier & Bettina Weiss, SEMI/PV Group Photovoltaic Standards Committee (Courtesy of Photovoltaics International, December 2008)

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