Training by Experts in Materials Characterization and Surface Analysis
 About EAG |
Techniques & Services |
Solutions |
Customer Service |
Training |
News & Events |
Publications |
Investor Relations |
Contact Us |
Training
SIMS Instrumentation: Related Instruments
Time-of-flight SIMS instruments are common. However, the sputtering duty cycle is low. A time-of-flight instrument is appropriate for static SIMS in contrast to dynamic SIMS. Only dynamic SIMS will be treated in this surface analysis tutorial because only dynamic SIMS yields quantitative information.
